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Probing structure and microstructure of epitaxial Ni–Mn–Ga films by reciprocal space mapping and pole figure measurements
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$1 001 cav_un_epca*0256060 $1 011 $a 1359-6454 $e 1873-2453 $1 200 1 $a Acta Materialia $v Roč. 58, č. 20 (2010), 6665-6671 $1 210 $c Elsevier 610 0-
$a reciprocal space mapping 610 0-
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Number of the records: 1