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Limits of applicability of a time-of-flight ion-mass analyzer in uncovering partial currents of ions emitted by pulsed laser ion sources
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$a Limits of applicability of a time-of-flight ion-mass analyzer in uncovering partial currents of ions emitted by pulsed laser ion sources 215 $a 10 s. 463 -1
$1 001 cav_un_epca*0257532 $1 011 $a 1042-0150 $e 1029-4953 $1 200 1 $a Radiation Effects and Defects in Solids $v Roč. 165, 6-10 (2010), s. 441-450 $1 210 $c Taylor & Francis 610 0-
$a laser-produced plasma 610 0-
$a time-resolved current deconvolution 610 0-
$a ion velocity distribution 610 0-
$a drift velocity of ions 700 -1
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$3 cav_un_auth*0221789 $i Výkonové systémy $j High power systems $w Laser Physics at ELI Beamlines $4 070 $a Velyhan $b Andriy $p FZU-D $T Fyzikální ústav AV ČR, v. v. i. 701 -1
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Number of the records: 1