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RBS, UV-VIS and XPS characterization of 40 keV Ni+ implanted PEEK, PET and PI
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$a RBS, UV-VIS and XPS characterization of 40 keV Ni+ implanted PEEK, PET and PI 215 $a 1 s. 463 -1
$1 200 1 $a 16th International Conference on Ion Beam Modification of Materials Book of Abstracts $v S. 317-317 $1 210 $a Dresden $c Institute of Ion Beam Physics and Materials Research, Forschungzentrum Dresden-Rossendorf $d 2008 541 1-
$a RBS, UV-VIS a XPS charakterizace Ni+ 40 keV implantovaných polymerů PEEK, PET a PI $z cze 610 0-
$a ion implantation in polymers 610 0-
$a TRIDYN 610 0-
$a Ion Beam Analysis 610 0-
$a UV-VIS, XPS 700 -1
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Number of the records: 1