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Low frequency noise and I-V characteristic as characterization tools for 2.3 µm CW GaSb based laser diodes
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$a eng 102 $a CZ 200 1-
$a Low frequency noise and I-V characteristic as characterization tools for 2.3 µm CW GaSb based laser diodes 215 $a 3 s. 463 -1
$1 200 1 $a Research Activities of Physics Departments of Civil Engineering Faculties in the Czech and Slovak Republics $v s. 184-186 $1 010 $a 80-7204-353-6 $1 210 $a Brno $c Brno University of Technology $d 2004 $1 702 $a Pazdera $b L. $4 340 $1 702 $a Kořenská $b M. $4 340 541 $a Nízkofrekvenční šum a V-A charakteristiky kontinuálních GaSb laserových diod pro 2.3µm $z cze 610 1-
$a low frequency noise 610 1-
$a GaSb 700 -1
$a Vaněk $b J. $y CZ $4 070 $3 cav_un_auth*0015169 701 -1
$a Brzokoupil $b V. $y CZ $4 070 $3 cav_un_auth*0019657 701 -1
$a Chobola $b Z. $y CZ $4 070 $3 cav_un_auth*0019658 701 -1
$a Hulicius $b Eduard $p FZU-D $w Semiconductors $4 070 $3 cav_un_auth*0100250 $T Fyzikální ústav AV ČR, v. v. i. 701 -1
$a Šimeček $b Tomislav $p FZU-D $4 070 $3 cav_un_auth*0100554 $T Fyzikální ústav AV ČR, v. v. i.
Number of the records: 1