On-the-fly fast X-ray tomography using a CdTe pixelated detector – application in mechanical testing

Kumpová, I., Vopálenský, M., Fíla, T., Kytýř, D., Vavřík, D., Pichotka, M., Jakůbek, J., Keršner, Z., Klon, J., Seitl, S., Sobek, J. On-the-fly fast X-ray tomography using a CdTe pixelated detector – application in mechanical testing. IEEE Transactions on Nuclear Science. 2018, 65(12), 2870-2876. ISSN 0018-9499. E-ISSN 1558-1578. Available: doi: 10.1109/TNS.2018.2873830.