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Effect of Auger recombination on transient optical properties in XUV and soft X-ray irradiated silicon nitride
- 1.Tkachenko, V., Lipp, V., Buescher, M., Capotondi, F., Hoeppner, H., Medvedev, N., Pedersoli, E., Prandolini, M.J., Rossi, G.M., Tavella, F., Toleikis, S., Windeler, M., Ziaja, B., Teubner, U. Effect of Auger recombination on transient optical properties in XUV and soft X-ray irradiated silicon nitride. Scientific Reports. 2021, 11(1), 5203. ISSN 2045-2322. E-ISSN 2045-2322. Available: https://doi.org/10.1038/s41598-021-84677-w.
Number of the records: 1