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Ultrafast dynamics of hot charge carriers in an oxide semiconductor probed by femtosecond spectroscopic ellipsometry
- 1.Richter, S., Herrfurth, O., Espinoza Herrera, S. J., Rebarz, M., Kloz, M., Leveillee, J.A., Schleife, A., Zollner, S., Grundmann, M., Andreasson, J., Schmidt-Grund, R. Ultrafast dynamics of hot charge carriers in an oxide semiconductor probed by femtosecond spectroscopic ellipsometry. New Journal of Physics. 2020, 22(8), 1-15), 083066. ISSN 1367-2630. E-ISSN 1367-2630. Available: doi: 10.1088/1367-2630/aba7f3.
Number of the records: 1