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Determination of thickness refinement using STEM detector segments
- 1.Skoupý, R., Krzyžánek, V. Determination of thickness refinement using STEM detector segments. In: 10th Anniversary International Conference on Nanomaterials - Research and Application (NANOCON 2018). Ostrava: Tanger, 2019, s. 677-681. ISBN 978-80-87294-89-5.
Number of the records: 1