Inelastic mean free path from raw data measured by low-energy electrons time-of-flight spectrometer

Zouhar, M., Radlička, T., Oral, M., Konvalina, I. Inelastic mean free path from raw data measured by low-energy electrons time-of-flight spectrometer. In: Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 86-87. ISBN 978-80-87441-23-7.