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Xenon focused ion beam in the shape memory alloys investigation – the case of NiTi and CoNiAl
- 1.Kopeček, J., Jurek, K., Kopecký, V., Klimša, L., Seiner, H., Sedlák, P., Landa, M., Dluhoš, J., Petrenec, M., Hladík, L., Doupal, A., Heczko, O. Xenon focused ion beam in the shape memory alloys investigation – the case of NiTi and CoNiAl. Microscopy and Microanalysis. 2014, 20(Aug), 335-336. ISSN 1431-9276. E-ISSN 1435-8115. Available: doi: 10.1017/S1431927614003390
Number of the records: 1