Number of the records: 1
Quantitative low-energy ion beam characterization by beam profiling and imaging via scintillation screens.
- 1.Germer, S., Pietag, F., Polák, J., Arnold, T. Quantitative low-energy ion beam characterization by beam profiling and imaging via scintillation screens. Review of Scientific Instruments. 2016, 87(11), 113301. ISSN 0034-6748. E-ISSN 1089-7623. Available: doi: 10.1063/1.4964701.
Number of the records: 1