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Profilometry of thin films on rough substrates by Raman spectroscopy
- 1.Ledinský, M., Paviet-Salomon, B., Vetushka, A., Geissbühler, J., Tomasi, A., Despeisse, M., De Wolf, S., Ballif, C., Fejfar, A. Profilometry of thin films on rough substrates by Raman spectroscopy. Scientific Reports. 2016, 6(Dec), 1-7), 37859. ISSN 2045-2322. E-ISSN 2045-2322. Available: doi: 10.1038/srep37859
Number of the records: 1