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Characterization of thin MnSi and MnGe Layers Prepared by Reactive UV Pulsed Laser Deposition.
- 1.Koštejn, M., Fajgar, R., Dytrych, P., Kupčík, J., Dřínek, V., Jandová, V., Huber, Š., Novotný, F. Characterization of thin MnSi and MnGe Layers Prepared by Reactive UV Pulsed Laser Deposition. Thin Solid Films. 2016, 619(NOV 30), 73-80. ISSN 0040-6090. E-ISSN 1879-2731. Available: doi: 10.1016/j.tsf.2016.10.035
Number of the records: 1