Number of the records: 1
Detection of Secondary Electrons by Scintillation Detector at VP SEM
- 1.Jirák, J., Čudek, P., Neděla, V. Detection of Secondary Electrons by Scintillation Detector at VP SEM. Microscopy and Microanalysis. 2011, 17(Suppl. 2), 922-923. ISSN 1431-9276. E-ISSN 1435-8115. Available: doi: 10.1017/S1431927611005484
Number of the records: 1