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Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates
- 1.Holovský, J., Dagkaldiran, U., Remeš, Z., Purkrt, A., Ižák, T., Poruba, A., Vaněček, M. Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates. Physica Status Solidi A. 2010, 207(9), 578-581. ISSN 1862-6300. E-ISSN 1862-6319. Available: doi: 10.1002/pssa.200982890
Number of the records: 1