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Exchange bias of a ferromagnetic semiconductor by a ferromagnetic metal: Fe/(Ga,Mn)As bilayer films studied by XMCD measurements and SQUID magnetometry
- 1.Olejník, K., Wadley, P., Haigh, J.A., Edmonds, K. W., Campion, R. P., Rushforth, A.W., Gallagher, B. L., Foxon, C. T., Jungwirth, T., Wunderlich, J., Dhesi, S.S., Cavill, S.A., van der Laan, G., Arenholz, E. Exchange bias of a ferromagnetic semiconductor by a ferromagnetic metal: Fe/(Ga,Mn)As bilayer films studied by XMCD measurements and SQUID magnetometry. Physical Review. B. 2010, 81(10), 104402/1-104402/5. ISSN 1098-0121. Available: doi: 10.1103/PhysRevB.81.104402
Number of the records: 1