Limits of applicability of a time-of-flight ion-mass analyzer in uncovering partial currents of ions emitted by pulsed laser ion sources

Krása, J., Láska, L., Rohlena, K., Velyhan, A., Czarnecka, A., Parys, P., Ryc, L., Wolowski, J. Limits of applicability of a time-of-flight ion-mass analyzer in uncovering partial currents of ions emitted by pulsed laser ion sources. Radiation Effects and Defects in Solids. 2010, 165(6-10), 441-450. ISSN 1042-0150. E-ISSN 1029-4953. Available: doi: 10.1080/10420151003718402