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Investigation of electrical and dielectric properties of Ge20Se80-xTex glasses doped by Er, Ho, Pr
- 1.Kalužný, J., Pedlíková, J., Kostka, P., Labaš, V., Kubliha, M., Zavadil, J., Minárik, S. Investigation of electrical and dielectric properties of Ge20Se80-xTex glasses doped by Er, Ho, Pr. Journal of Optoelectronics and Advanced Materials. 2009, 11(12), 2063-2068. ISSN 1454-4164. E-ISSN 1841-7132.
Number of the records: 1