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Non-destructive Depth Profiling of the Activated Ti-Zr-V Getter by Means of Excitation Energy Resolved Photoelectron Spectroscopy
- 1.Pavluch, J., Zommer, L., Mašek, K., Skála, T., Šutara, F., Nehasil, V., Píš, I., Polyak, Y. Non-destructive Depth Profiling of the Activated Ti-Zr-V Getter by Means of Excitation Energy Resolved Photoelectron Spectroscopy. Analytical Sciences. 2010, 26(2), 209-215. ISSN 0910-6340. E-ISSN 1348-2246. Available: doi: 10.2116/analsci.26.209
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