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Scanning low energy electron microscopy of doped silicon at units of eV
- 1.Hovorka, M., Mikmeková, Š., Frank, L. Scanning low energy electron microscopy of doped silicon at units of eV. In: 6th International Workshop on LEEM/PEEM. Trieste: ELETTRA, 2008, s. 110. ISBN N.
Number of the records: 1