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Preparation of location-specific thin foils from Fe-3%Si bi- and tri- crystals for examination in a FEG-STEM
- 1.Sorbello, F., Hughes, G.M., Lejček, P., Heard, P.J., Flewitt, P.E.J. Preparation of location-specific thin foils from Fe-3%Si bi- and tri- crystals for examination in a FEG-STEM. Ultramicroscopy. 2009, 109(2), 147-153. ISSN 0304-3991. E-ISSN 1879-2723. Available: doi: 10.1016/j.ultramic.2008.08.011
Number of the records: 1