Number of the records: 1
SHIM and TPEM: Getting More Information from Non Linear Excitation
- 1.Bianchini, P., Vicidomini, G., Mondal, P. P., Ramoino, P., Usai, C., Janáček, J., Kubínová, L., Diaspro, A. SHIM and TPEM: Getting More Information from Non Linear Excitation. In: Focus on Microscopy. Valencia: University of Valencia, 2007, s. 136-136.
Number of the records: 1