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The use of an optically trapped microprobe for scanning details of surface
- 1.Šerý, M., Jákl, P., Ježek, J., Jonáš, A., Zemánek, P., Liška, M. The use of an optically trapped microprobe for scanning details of surface. In: Proceedings of the 13th Polish-Czech-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics (Proc. SPIE 5259). Washington: SPIEThe International Society for Optical Engineering, 2003, s. 166 - 169.
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