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SLEEM Imaging of Doping Patterns in Semiconductors
- 1.Müllerová, I., Frank, L., El Gomati, M. M. SLEEM Imaging of Doping Patterns in Semiconductors. In: DINI, L., CATALANO, M., eds. Proceedings of 5th Multinational Congress on Electron Microscopy. Lecce: Rinton Press, 2001, s. 317-318. ISBN 1-58949-003-7.
Number of the records: 1