Number of the records: 1
Scanning Electron Microscopy of Nonconductive Specimens at Critical Energies in a Cathode Lens System
- 1.Frank, L., Zadražil, M., Müllerová, I. Scanning Electron Microscopy of Nonconductive Specimens at Critical Energies in a Cathode Lens System. Scanning. 2001, 23(1), 36-50. ISSN 0161-0457. E-ISSN 1932-8745.
Number of the records: 1