Low frequency noise and I-V characteristic as characterization tools for 2.3 µm CW GaSb based laser diodes

Vaněk, J., Brzokoupil, V., Chobola, Z., Hulicius, E., Šimeček, T. Low frequency noise and I-V characteristic as characterization tools for 2.3 µm CW GaSb based laser diodes. In: PAZDERA, L., KOŘENSKÁ, M., eds. Research Activities of Physics Departments of Civil Engineering Faculties in the Czech and Slovak Republics. Brno: Brno University of Technology, 2004, s. 184-186. ISBN 80-7204-353-6.