On-the-fly fast X-ray tomography using a CdTe pixelated detector – application in mechanical testing

KUMPOVÁ, I., VOPÁLENSKÝ, M., FÍLA, T., KYTÝŘ, D., VAVŘÍK, D., PICHOTKA, M., JAKŮBEK, J., KERŠNER, Z., KLON, J., SEITL, S., SOBEK, J. On-the-fly fast X-ray tomography using a CdTe pixelated detector – application in mechanical testing. IEEE Transactions on Nuclear Science. 2018, 65(12), 2870-2876. ISSN 0018-9499. E-ISSN 1558-1578. Available: doi: 10.1109/TNS.2018.2873830.