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Effect of Auger recombination on transient optical properties in XUV and soft X-ray irradiated silicon nitride
- 1.TKACHENKO, V., LIPP, V., BUESCHER, M., CAPOTONDI, F., HOEPPNER, H., MEDVEDEV, N., PEDERSOLI, E., PRANDOLINI, M.J., ROSSI, G.M., TAVELLA, F., TOLEIKIS, S., WINDELER, M., ZIAJA, B., TEUBNER, U. Effect of Auger recombination on transient optical properties in XUV and soft X-ray irradiated silicon nitride. Scientific Reports. 2021, 11(1), 5203. ISSN 2045-2322. E-ISSN 2045-2322. Available: doi: 10.1038/s41598-021-84677-w.
Number of the records: 1