Number of the records: 1
Determination of Composition and Thickness of MnSi and MnGe Layers by EDS.
- 1.KOŠTEJN, M., FAJGAR, R., DŘÍNEK, V., JANDOVÁ, V., NOVOTNÝ, F. Determination of Composition and Thickness of MnSi and MnGe Layers by EDS. Journal of Nondestructive Evaluation. 2020, 39(2), 40. ISSN 0195-9298. E-ISSN 1573-4862. Available: doi: 10.1007/s10921-020-00685-2.
Number of the records: 1