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Ultrafast dynamics of hot charge carriers in an oxide semiconductor probed by femtosecond spectroscopic ellipsometry
- 1.RICHTER, S., HERRFURTH, O., ESPINOZA HERRERA, S. J., REBARZ, M., KLOZ, M., LEVEILLEE, J.A., SCHLEIFE, A., ZOLLNER, S., GRUNDMANN, M., ANDREASSON, J., SCHMIDT-GRUND, R. Ultrafast dynamics of hot charge carriers in an oxide semiconductor probed by femtosecond spectroscopic ellipsometry. New Journal of Physics. 2020, 22(8), 1-15), 083066. ISSN 1367-2630. E-ISSN 1367-2630. Available: doi: 10.1088/1367-2630/aba7f3.
Number of the records: 1