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Study of electron scattering phenomena of advanced materials by UHV SLEEM/ToF
- 1.KONVALINA, I., DANIEL, B., ZOUHAR, M., PATÁK, A., PIŇOS, J., RADLIČKA, T., FRANK, L., MÜLLEROVÁ, I., MATERNA MIKMEKOVÁ, E. Study of electron scattering phenomena of advanced materials by UHV SLEEM/ToF. In: Microscopy 2020. Praha: Československá mikroskopická společnost, 2020, s. 95-96.
Number of the records: 1