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Xenon focused ion beam in the shape memory alloys investigation – the case of NiTi and CoNiAl

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    KOPEČEK, J., JUREK, K., KOPECKÝ, V., KLIMŠA, L., SEINER, H., SEDLÁK, P., LANDA, M., DLUHOŠ, J., PETRENEC, M., HLADÍK, L., DOUPAL, A., HECZKO, O. Xenon focused ion beam in the shape memory alloys investigation – the case of NiTi and CoNiAl. Microscopy and Microanalysis. 2014, 20(Aug), 335-336. ISSN 1431-9276. DOI: 10.1017/S1431927614003390
Number of the records: 1