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Practical Use of Scanning Low Energy Electron Microscope (SLEEM)
- 1.MÜLLEROVÁ, I., MIKMEKOVÁ, E., MIKMEKOVÁ, Š., KONVALINA, I., FRANK, L. Practical Use of Scanning Low Energy Electron Microscope (SLEEM). Microscopy and Microanalysis. 2016, 22(S3), 1650-1651. ISSN 1431-9276. E-ISSN 1435-8115. Available: doi: 10.1017/S1431927616009090
Number of the records: 1