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Characterization of amorphous and microcrystalline Si layers and ZnO layers on glass
- 1.VANĚČEK, M., HOLOVSKÝ, J., PORUBA, A., REMEŠ, Z., PURKRT, A. Characterization of amorphous and microcrystalline Si layers and ZnO layers on glass. Praha: Tel Solar AG, Trübbach, Switzerland, 2015.
Number of the records: 1