Number of the records: 1
Characterisation of silicon carbide layers formed during BNCD deposition
- 1.TAYLOR, A., ASHCHEULOV, P., ČADA, M., DRAHOKOUPIL, J., FEKETE, L., KLIMŠA, L., OLEJNÍČEK, J., REMEŠ, Z., ČTVRTLÍK, R., TOMÁŠTÍK, J., JANÍČEK, P., MISTRÍK, J., KOPEČEK, J., MORTET, V. Characterisation of silicon carbide layers formed during BNCD deposition. In: Diamond Conference. Coventry: University of Warwick, 2015, P6.1-P6.3.
Number of the records: 1