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FIB Induced Damage Examined with the Low Energy SEM
- 1.MIKMEKOVÁ, Š., MATSUDA, K., WATANABE, K., IKENO, S., MÜLLEROVÁ, I., FRANK, L. FIB Induced Damage Examined with the Low Energy SEM. Materials Transactions. 2011, 52(3), 292-296. ISSN 1345-9678. E-ISSN 1347-5320. Available: doi: 10.2320/matertrans.MB201005
Number of the records: 1