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Characterization and Properties of Titanium-Vanadium Oxide Thin Films Prepared by ArF Laser Ablation
- 1.FAJGAR, R., KUPČÍK, J., ŠUBRT, J., NOVOTNÝ, F. Characterization and Properties of Titanium-Vanadium Oxide Thin Films Prepared by ArF Laser Ablation. In: Conference Proceedings. Ostrava: TANGER, 2010, s. 398-402. ISBN 978-80-87294-19-2.
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