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Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon
- 1.VERVENIOTIS, E., REZEK, B., ŠÍPEK, E., STUCHLÍK, J., KOČKA, J. Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon. Thin Solid Films. 2010, 518(21), 5965-5970. ISSN 0040-6090. E-ISSN 1879-2731. Available: doi: 10.1016/j.tsf.2010.05.107
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