Optical and scanning electron microscopies in examination of ultrathin foils

KONVALINA, I., HOVORKA, M., FOŘT, T., MÜLLEROVÁ, I. Optical and scanning electron microscopies in examination of ultrathin foils. In: MIKA, F., ed. Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments AS CR, v.v.i, 2010, s. 23-24. ISBN 978-80-254-6842-5.