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Novel approach to material evaluation of thin surface layers by resonant ultrasound spectroscopy
- 1.LANDA, M., RŮŽEK, M., SEDLÁK, P., SEINER, H., BODNÁROVÁ, L., ZÍDEK, J. Novel approach to material evaluation of thin surface layers by resonant ultrasound spectroscopy. Journal of Physics: Conference Series. 2010, 214(1), 1-5. ISSN 1742-6588. E-ISSN 1742-6596. Available: doi: 10.1088/1742-6596/214/1/012045.
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