Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser

CIHELKA, J., JUHA, L., CHALUPSKÝ, J., ROSMEJ, F.B., RENNER, O., SAKSL, K., HÁJKOVÁ, V., VYŠÍN, L., GALTIER, E., SCHOTT, R., KHORSAND, A.R., RILEY, D., DZELZAINIS, T., NELSON, A., LEE, R. W., HEIMANN, P., NAGLER, B., VINKO, S., WARK, J., WHITCHER, T., TOLEIKIS, S., TSCHENTSCHER, T., FÄUSTLIN, R., WABNITZ, H., BAJT, S., CHAPMAN, H., KRZYWINSKI, J., SOBIERAJSKI, R., KLINGER, D., JUREK, M., PELKA, J., HAU-RIEGE, S., LONDON, R.A., KUBA, J., STOJANOVIC, N., SOKOLOWSKI-TINTEN, K., GLEESON, A.J., STÖRMER, M., ANDREASSON, J., HAJDU, J., TIMNEANU, N. Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser. In: JUHA, L., BAJT, S., SOBIERAJSKI, R., eds. Damage to VUV, EUV, and X-ray Optics II. Bellingham: SPIE, 2009, 73610P/1-73610P/10. Proceedings of SPIE, 7361. ISBN 9780819476357. ISSN 0277-786x. Available: http://dx.doi.org/10.1117/12.822766