Secondary electron contrast in doped semiconductor with presence of a surface ad-layer

MIKA, F., HOVORKA, M., FRANK, L. Secondary electron contrast in doped semiconductor with presence of a surface ad-layer. In: MC 2009 - Microscopy Conference: First Joint Meeting of Dreiländertagung and Multinational Conference on Microscopy. Graz: Verlag der Technischen Universität, 2009, Vol. 1: 199-200. ISBN 978-3-85125-062-6. Available: http://www.univie.ac.at/asem/Graz_MC_09/papers/51426.pdf