Soft x-ray free electron laser microfocus for exploring matter under extreme conditions

NELSON, A.J., TOLEIKIS, S., CHAPMAN, H., BAJT, S., KRZYWINSKI, J., CHALUPSKÝ, J., JUHA, L., CIHELKA, J., HÁJKOVÁ, V., VYŠÍN, L., BURIAN, T., KOZLOVÁ, M., FÄUSTLIN, R.R., NAGLER, B., VINKO, S.M., WHITCHER, T., DZELZAINIS, T., RENNER, O., SAKSL, K., KHORSAND, A.R., HEIMANN, P.A., SOBIERAJSKI, R., KLINGER, D., JUREK, M., PELKA, J., IWAN, B., ANDREASSON, J., TIMNEANU, N., FAJARDO, M., WARK, J. S., RILEY, D., TSCHENTSCHER, T., HAJDU, J., LEE, R. W. Soft x-ray free electron laser microfocus for exploring matter under extreme conditions. Optics Express. 2009, 17(20), 18271-18278. ISSN 1094-4087. Available: doi: 10.1364/OE.17.018271