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SHIM and TPEM: Getting More Information from Non Linear Excitation
- 1.BIANCHINI, P., VICIDOMINI, G., MONDAL, P. P., RAMOINO, P., USAI, C., JANÁČEK, J., KUBÍNOVÁ, L., DIASPRO, A. SHIM and TPEM: Getting More Information from Non Linear Excitation. In: Focus on Microscopy. Valencia: University of Valencia, 2007, s. 136-136.
Number of the records: 1