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Combination of Scanning Auger and Very-Low-Energy Electron Microscopy
- 1.EL GOMATI, M. M., MÜLLEROVÁ, I., FRANK, L. Combination of Scanning Auger and Very-Low-Energy Electron Microscopy. In: KIRKLAND, A., BROWN, P. D., eds. Proceedings of the International Centennial Symposium on the Electron. Cambridge: The University Press, 1998, s. 326-333. ISBN 1-86125-051-7.
Number of the records: 1