Number of the records: 1
Quantitative depth profiling of K-doped fullerene films using XPS and SIMS
- 1.OSWALD, S., JANDA, P., DUNSCH, L. Quantitative depth profiling of K-doped fullerene films using XPS and SIMS. Microchimica Acta. 2003, 141(1-2), 79-85. ISSN 0026-3672. E-ISSN 1436-5073.
Number of the records: 1