On-the-fly fast X-ray tomography using a CdTe pixelated detector – application in mechanical testing

KUMPOVÁ, Ivana, VOPÁLENSKÝ, Michal, FÍLA, Tomáš, KYTÝŘ, Daniel, VAVŘÍK, Daniel, PICHOTKA, Martin, JAKŮBEK, Jan, KERŠNER, Z., KLON, J., SEITL, S., SOBEK, J. On-the-fly fast X-ray tomography using a CdTe pixelated detector – application in mechanical testing. IEEE Transactions on Nuclear Science. 2018, 65(12), 2870-2876. ISSN 0018-9499. E-ISSN 1558-1578. Available: doi: 10.1109/TNS.2018.2873830.