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Apparatus for spectrum and intensity profile characterization of a beam, use thereof and method thereof
- 1.NEJDL, Jaroslav. Apparatus for spectrum and intensity profile characterization of a beam, use thereof and method thereof. Utility model or industrial design US10914628B2. 9. 2. 2021. Available: https://worldwide.espacenet.com/patent/search/family/060327011/publication/US10914628B2?q=US10914628B2
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