Number of the records: 1  

Surface imaging with UHV SLEEM and SEM LEEM

  1. 1.
    MIKMEKOVÁ, Šárka, JÁNSKÝ, P., KOLAŘÍK, V., MÜLLEROVÁ, Ilona. Surface imaging with UHV SLEEM and SEM LEEM. Microscopy and Microanalysis. 2019, 25(S2), 444-445. ISSN 1431-9276. E-ISSN 1435-8115. Available: doi: 10.1017/S1431927619002952
Number of the records: 1  

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