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Profilometry with sub-nanometre precision by Raman spectroscopy
- 1.LEDINSKÝ, Martin, HÁJKOVÁ, Zdeňka, VETUSHKA, Aliaksi, TOMASI, A., PAVIET-SALOMON, B., DESPEISSE, M., ŘÁHOVÁ, Jaroslava, FRANK, O., DE WOLF, S., BALLIF, C., FEJFAR, Antonín. Profilometry with sub-nanometre precision by Raman spectroscopy. In: SHRBENÁ, J., ed. NANOCON 2016. List of Abstracts. Ostrava: Tanger Ltd., 2016, s. 56-56. ISBN 978-80-87294-68-0.
Number of the records: 1